The WT-2000PVN can measure blocks and ingots, as well as wafers and cells. For measuring wafers and cells, people typically produce maps. When measuring blocks or ingots, people often produce only ...
Wafer bowing causes measurement errors as the wafer is scanned. A unique custom self-calibration tool and algorithm finds very small angular errors in the cameras and the machine uses this information ...
ACM Research's new SPM tool enhances wafer processing efficiency and cleanliness, gaining qualification from a key Chinese semiconductor manufacturer. ACM Research, Inc. announced that its Single ...
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