As one of the most popular tools used today to analyze data in the semiconductor manufacturing process, wafer-mapping software is capable of calculating reasons of yield loss, as well as identify the ...

The wafer map is a lookup table of test result vs die location, and this is what is fed into the assembly line to pick out the good die to package. This used to be done by the machine ink-spotting ...

Sinovoltaics has released updates to its map of planned and existing manufacturing of solar PV in the North American supply ...

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It has been developed for automated mapping of 200 mm and 300 mm semiconductor and compound semiconductor wafers, and can be configured with either four-point probe (4PP) or non-contact eddy current ...

Zeta Multi-Mode capability means that bump height, film thickness, roughness, and wafer bow can be measured without the need ... camera and optics to enable automated defect inspection by mapping ...