The brief was that the wafer probe yield was disastrous and the correlation wafer was not giving the correct results. Getting to the punch line is going to require some IC fabrication background ...

MPI TS150–THZ probe system is a dedicated, manual probe system designed to handle single die MMICs and upward to 150 mm wafers. The station has mmWave probing points on East-West axes and generic DC ...

FormFactor (FORM) is a $2.5 billion OEM of automated wafer probe cards and other testing devices used in the back-end portion of the semiconductor manufacturing process. FORM serves the requirements ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Model FWPX is a versatile cryogenic ...

Wafer testing is conducted using Automatic Test Equipment (ATE) along with test infrastructures such as the Prober Interface Board (PIB), signal tower, and probe card. In this paper, we present the ...

Our company develops and offers complete turn-key solutions covering front-end engineering test, wafer and dice probing and final test, as well as wafer sawing, packaging, and assembly. Our services ...