Keysight Technologies, Inc. KEYS has strengthened its double-pulse test portfolio, offering engineers a precise and efficient ...

Intel has run its initial lots of 18A wafers at its Arizona fab, with Fab 52 and Fab 62 pumping out Intel 18A wafers, ahead ...

Dice being singulated with a diamond saw The general plan is to use testing at a variety of points to improve overall quality, by weeding out bad wafers (PCM data) bad die (wafer probe ...

A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...

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Wafer-level testing Teradyne says that the deal will enable it to deliver scalable PIC test solutions at a time when PIC ...

Teradyne, Inc. (Nasdaq: TER) today announced it has entered into a definitive agreement to acquire privately held Quantifi ...

A combination of many tools from a variety of sources is needed to test and verify on-wafer RF devices. Why are on-wafer probing systems useful? How Maury Microwave’s solution helps optimize ...

MEMS (Micro-Electro-Mechanical Systems, MEMS) probe card with the optimized structure and is an ideal to support fine-pitch and high-pin count test requirements. The Virgo Prima MEMS micro-cantilever ...

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