The wafer map is a lookup table of test result vs die location, and this is what is fed into the assembly line to pick out the good die to package. This used to be done by the machine ink-spotting ...

flexible mapping of multicristalline silicon bricks and wafers. Simultaneous measurement of minority carrier lifetime, photoconductivity, resistivity and sample flatness, all maps at the same time.

The WT-2000PVN can measure blocks and ingots, as well as wafers and cells. For measuring wafers and cells, people typically produce maps. When measuring blocks or ingots, people often produce only ...

It has been developed for automated mapping of 200 mm and 300 mm semiconductor and compound semiconductor wafers, and can be configured with either four-point probe (4PP) or non-contact eddy current ...