Dice being singulated with a diamond saw The general plan is to use testing at a variety of points to improve overall quality, by weeding out bad wafers (PCM data) bad die (wafer probe ...

Intel has run its initial lots of 18A wafers at its Arizona fab, with Fab 52 and Fab 62 pumping out Intel 18A wafers, ahead ...

A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...

View Aehr Test Systems AEHR stock quote prices, financial information, real-time forecasts, and company news from CNN.

Wafer-level testing Teradyne says that the deal will enable it to deliver scalable PIC test solutions at a time when PIC ...

A combination of many tools from a variety of sources is needed to test and verify on-wafer RF devices. Why are on-wafer probing systems useful? How Maury Microwave’s solution helps optimize ...

Detailed price information for Aehr Test Systems (AEHR-Q) from The Globe and Mail including charting and trades.